NI PXI Microelectromechanical (MEMS) Test System
Purchase or customize a pre-configured PXI system designed for testing MEMS devices
View ArticleSemiconductor Test
National Instruments offers a variety of products for testing common semiconductor devices, including ADCs/DACs, Power Management ICs, Wireless ICs, and microelectromechanical system (MEMS) devices for...
View ArticleUsing the Newest Modular Instrumentation to Streamline Semiconductor Test
This year, more than ever, semiconductor engineers are doing more with less. A recent EE Times article predicts that semiconductors ticketed for electronics equipment won’t r...
View ArticleNI Hosts Inaugural Semiconductor Test Summit
National Instruments Taiwan today is hosting the inaugural Semiconductor Test Summit in Taipei. Industry leaders including Teradyne, Chroma, Tektronix, ON Semiconductor and Sunplus are on hand to...
View ArticlePXI Application Areas
Consumer Electronics Test Hardware-in-the-Loop Test Semiconductor Test RF and Communications Test Audio and Video Test Military Electronics Test Consumer Electronics Test Mi...
View ArticleDon’t Compromise on Performance for Microwave Measurements
Introducing the 14 GHz NI PXIe-5665 RF Vector Signal Analyzer An RF signal analyzer with industry-leading performance at frequencies as high as 14 GHz is not only hard to find, but...
View ArticleST-Ericsson Reduces Semiconductor Test Time 10X Using LabVIEW and NI PXI RF...
Upgrading a characterization lab with a flexible validation test solution that could meet a variety of RF standards for semiconductor chip tests.
View ArticleNew NI PXI Solid-State Switch Boosts RF Test Speed and System Life
Today NI introduced the new NI PXI/PXIe-2543 solid-state switch module, which gives engineers faster switching and an unlimited mechanical lifetime for routing RF signals up to 6.6 GHz.
View ArticleNational Instruments Expands SMU Family With Industry-Leading Channel Density
At Semicon West, NI announced the expansion of its line of PXI SMUs for automated semiconductor test with the new NI PXIe-4143 SMU.
View ArticleNI Demonstrates New 4-Channel SMU at Semicon West
The new NI PXIe-4143 source measure unit (SMU) features the highest channel density of any SMU on the market and one of the fastest sample rates, making it ideal for parallel testing of multipin...
View ArticleNI PXI Power Management IC (PMIC) Test System
Purchase or customize a pre-configured PXI system designed for testing Power Management ICs (PMICs)
View ArticleNI PXI Wireless IC (RFIC) Test System
Purchase or customize a pre-configured PXI system designed for testing Wireless ICs (RFICs)
View ArticleCredence Systems Uses NI Modular Instruments to Extend Semiconductor Test...
Creating a test solution that performs specialized high-frequency measurements to meet diverse semiconductor application needs.
View ArticleNI PXI Microelectromechanical (MEMS) Test System
Purchase or customize a pre-configured PXI system designed for testing MEMS devices
View ArticleG Systems Designs Flexible Semiconductor Test Executive with LabVIEW and NI...
Designing and implementing a custom functional test system for producing many types of semiconductor hybrids. The system should provide a flexible test architecture, easy-to-use development...
View ArticleSemiconductor Test
National Instruments offers a variety of products for testing common semiconductor devices, including ADCs/DACs, Power Management ICs, Wireless ICs, and microelectromechanical system (MEMS) devices for...
View ArticleNational Instruments Expands SMU Family With Industry-Leading Channel Density
At Semicon West, NI announced the expansion of its line of PXI SMUs for automated semiconductor test with the new NI PXIe-4143 SMU.
View ArticleUsing NI LabVIEW and NI ELVIS for IC Parametric Test in Electronic Test...
Developing a low-cost, parametric, integrated circuit (IC) test system to train engineering students in a laboratory environment while emulating expensive professional semiconductor production testers.
View ArticleLook Inside the NI Semiconductor Test System
Look Inside the NI Semiconductor Test System Overview See how STS makes it easy to integrate NI PXI into a semiconductor production test environment. View Now (watch) 1 minute video Requires Adobe...
View ArticleIDT Lowers Cost of Test by Adopting the NI Semiconductor Test System
Keeping pace with continuously increasing test performance requirements in a fast moving environment where device performance is constantly pushing the limits of ATE system capabilities and thereby...
View Article
